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Publicações Publicações internacionais ISIE'97 Sumário
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Publicações
internacionais
Sumários ISIE'97: Microcontroller based applications are usually debugged with the assistance of in-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost debug tool that uses the Boundary Scan Test infrastructure to implement the basic functionality provided by an in-circuit emulator and a logic analyser is a possible solution to overcome this economical problem. To reduce costs, the Boundary Scan Test infrastructure is controlled through the parallel port of a standard Personal Computer, now widely available in classrooms.
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