Publ. pedagógica BLK:

Sumário:

This document describes a learning kit dedicated to the Boundary Scan Test technology. This learning kit is based on a dedicated ASIC processor able to control two boundary scan chains and may be used in stand-alone mode (where test program entry takes place via a keyboard) or connected to a standard Windows-type of computer (where a TASM-based cross assembler generates the test program to be downloaded via RS-232C). The kit contains a small BST board comprising two BST ICs (for small demonstration examples) and is accompanied by an external BST board comprising three BST ICs and two non-BST clusters of combinational logic.

Índice:

1 – INTRODUCTION

2 – MAIN BUILDING BLOCKS

Test processor and test program memory
System decoder and random logic
System supervisor and primary I/O controller
Embedded demo circuit

3 – USER INTERFACE

Memory access
Test circuit selection
Test program transfer
Operating modes
    Single step
    Breakpoint on address
    Breakpoint on data
    Segment execution
    Continuous clock execution
Test reset
Test program execution

4 – DEMO CIRCUITS

Embedded demo circuit
    Schematic
    Description
    Test program
External demo circuit
    Schematic
    Description
    Test program